Methods in Microscopy

About this journal

The first volume of MiM will be published with two issues. The next volume will have four issues.

Objectives

“Methods in Microscopy” is your gateway to cutting-edge microscopic and nanoscopic techniques. In an era of rapid scientific advancement, we recognize the importance of methodological innovation often overlooked in research. “Methods in Microscopy” offers an Open-Access platform for the peer-reviewed publication of these methods. Our mission is to make these techniques accessible to a wide audience, fostering understanding and accelerating scientific progress among experts and users.

Topics

Optical Microscopy
Fluorescence Microscopy
Super-Resolution Microscopy
(Low- and High Voltage) Electron Microscopy
Correlative Microscopy
Scanning Probe Microscopy
Microscopy combined with Spectroscopy
Image Analysis/Processing
Automated Microscopy Techniques
Software Development
Hardware Development

Article Formats

Research Articles, Review Articles, Letters, Editorials, News, Views

Your Benefits

First journal with a particular focus on methods in microscopy
Methods enjoy a high probability for citations
Co-operation with a leading global society will ensure rapid growth of the journal
Open Access publication with a full CC BY-license ensures widest dissemination of your research
High-quality single-blind review process
Accepted papers will be published online first as DOI-citable, forward-linked articles for quickest possible visibility to the scientific community

Open Access
From convolution to clarity: effect of different point spread functions for deconvolution in CLSM and STED microscopy images of the nuclear lamina

December 3, 2025

Merel Stiekema, Frans C. S. Ramaekers, Jos L. V. Broers, Marc A. M. J. van Zandvoort

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Blurring and noise (convolution) significantly affect the quality of microscopy images. To reverse this process, deconvolution can be applied. The Point Spread Function (PSF) of the microscope, which can be theoretically modelled or retrieved experimentally by using sub-resolution fluorescent beads, is indispensable for performing deconvolution. The study aimed to optimize the deconvolution approach for both Confocal Laser Scanning Microscopy (CLSM) and Stimulated Emission Depletion (STED) microscopy images of immunofluorescently labelled lamins A/C or lamin B1, important components of the nuclear lamina. For that purpose, the impact of using different PSFs on deconvolution performance was assessed visually and by determining the lamina thickness. For CLSM images, performing deconvolution with the experimental PSF led to a higher resolution compared to the theoretical PSF. For STED, the experimental PSF introduced a ringing artifact. Therefore, a new PSF for STED microscopy is introduced, the experimentally supported theoretical (EST) PSF. This uses parameters from the experimental PSF to create a theoretical PSF, which solves issues arising from noisy PSF recordings due to the very small size and thereby low fluorescence intensity of the sub-resolution fluorescent beads. In conclusion, for CLSM the experimental PSF was best for deconvolution, while for STED, the EST PSF was optimal.
Open Access
Two simple ways of making clean nitrogen-doped graphene for TEM studies

June 19, 2025

Ivan Musil, Lennart Rieger, Arkady V. Krasheninnikov, Jannik C. Meyer

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Graphene is the ideal transmission electron microscopy (TEM) support when it comes to imaging, but often offers poor interaction with samples due to its inert nature, making preparation of the TEM samples difficult. Graphitic nitrogen substitutions in graphene could boost its reactivity while simultaneously bringing minimal disturbance to its periodic structure. Here, two straightforward and easy to implement methods are shown for nitrogen doping of graphene that is already freely suspended on a TEM grid. One procedure utilizes a standard plasma cleaner capable of generating radio frequency plasma, for the other a simple direct current glow discharge plasma chamber was built. Successful implantation of graphitic nitrogen was achieved via both methods and verified by high resolution TEM. A series of experiments allowed to find satisfactory conditions for doping, yielding samples where nitrogen substitutions can be found and imaged within otherwise clean areas of graphene. Interaction of an adsorbate with graphitic nitrogen was observed on an atomic level, demonstrating its capability to bind other materials.
Open Access
Advantages of low voltage electron microscopy in semiconductor research

December 11, 2025

Michael Stöger-Pollach, Ze F. Scales, Leo Stöger, Firat Becer, Andreas Steiger-Thirsfeld

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Investigating semiconductors free of radiation damage on a sub-nanometer scale is essential for the development of modern semiconductor technologies. The robustness of such devices is often associated with chemical impurities that mainly decorate crystallographic lattice defects. Low voltage (scanning) transmission electron microscopy (LV-(S)TEM) combines all the analytical advantages of a (S)TEM with the fact that radiation damage is avoided. In addition, the optical properties can also be determined using valence electron energy loss spectrometry (VEELS), as relativistic energy losses can also be prevented. Using GaN we demonstrate the importance of the right choice of beam energy and discuss its influence on spatial resolution, since lattice defects are very localized. For GaN we find 60 keV to the best compromise between spatial resolution and damage free analytical investigations employing VEELS and cathodoluminescence (CL) without being altered by relativistic radiation emission, such as Čerenkov-radiation and its corresponding energy losses.
Open Access
Visualizing and simulating composite filtration mats: a study using X-ray microscopy and fluid flow simulations

December 10, 2025

Murilo I. Santos, Juliana M. de Souza e Silva, Daina Damberga, Markus Langner, Rafaela Debastiani, Ulrike Hirsch, Andreas Greiner, Ralf B. Wehrspohn

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Our research focuses on verifying the design of efficient composite filtration mats using simulations based on XRM volumetric data. Three filter mats were prepared with different amounts of PET microfibers and electrospun PAN nanofibers, with and without a diblock copolymer. The structure of the PET-PAN mats was characterized by SEM and XRM. Three-dimensional XRM images were used in fluid flow simulations and the filtration properties were evaluated by standard methods. Incorporating 5-µm PET fibers with 1 wt% PAN nanofibers and a diblock copolymer doubled efficiency in single-pass filtration test at a small pressure drop. Raising PAN to 2 wt% increased efficiency to 72 % but also increased the pressure drop. Simulated permeabilities from XRM volumes follow the same order and lie within experimental uncertainties. Streamlines illustrate fluid flow paths within the simulated environment, showing locations where fiber bundles create straight-through pores. XRM simulations showed flow paths, confirmed permeability trends, and can guide the optimization of fiber dispersion. Discrepancies between XRM volumes and bulk tests show that microscale heterogeneity dominates resistance. Larger volumes are needed for accurate prediction. Streamline-guided rules can shorten development cycles by indicating where to adjust fiber orientation, nanofiber amounts and copolymer amounts.
Open Access
A successful conclusion to MiM’s second year

December 11, 2025

Andreas F. Thoß, Martin Friedrich

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Open Access
A novel pressurized operando battery cell for laboratory X-ray computed tomography

October 1, 2025

Luca Weckelmann, Krzysztof Dzieciol, Christoph König, Chih-Long Tsai, Anna Windmüller, Luc Raijmakers, Hermann Tempel, Hans Kungl, Rüdiger-A. Eichel

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Battery research relies on microscopy techniques for their microstructure characterizations and operando mechanism investigations. Such techniques include scanning electron microscopy (SEM) or X-ray computed tomography (XCT). The latter one plays a special role due to its ability to visualize a sample or even a whole cell completely in three dimensions. Additionally, imaging is conducted without destructing the investigated sample enabling the possibility of operando measurements. Therefore, XCT advances to a highly valuable method for investigating battery components and interfaces in the pristine, intermediate and post-mortem state or while operating the battery. Despite the evident advantages, XCT of certain battery types such as lithium metal are challenging due to the combination of low and high attenuating materials and air sensitive elements. This work presents the development of a pressurized operando battery cell for laboratory X-ray computed tomography. The developed cell makes the investigation of air sensitive and for XCT challenging battery systems possible. It is resistant to various chemicals and air-tight, thus suitable for different battery types. A dynamic sealing via a metal bellow allows to set and change the stack pressure during operation and after assembly, respectively. The design is optimized for maintaining a high photon flux without neglecting a reliable long-term sealing and practical handling. Initial measurements of a symmetric lithium metal cell with hybrid solid electrolyte demonstrate the capabilities of the developed cell holder.
Open Access
Momentum and energy resolution

July 2, 2025

Christian Kramberger, Ryosuke Senga, Yung-Chang Lin, Kazu Suenaga, Thomas Pichler

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The energy and momentum transfered in an elastic scattering event from a fast electron to a plasmon are intimately linked. The in-plane ( q 2 D ) and out-of-plane transfered momenta ( q z ) are however fundamentally distinct in a two dimensional sheet. Their different characters manifest in a sign flip of the power law scaling of momentum and energy resolved electron energy loss spectroscopy at the optical limit ( q → 0). While the scattering cross section of a bulk systems diverges, the response of a dielectric sheet fades out. This makes freestanding 2D sheet materials like graphene a showcase to demonstrate momentum and energy resolution.
Open Access
The Dublin lens: a Cc = 1.0 mm objective lens intended for CryoEM at 100 keV

September 24, 2025

Germano Motta Alves, Theo Andrews, Patrick McBean, Torquil Wells, Mohamed M. El-Gomati, Stephan Burkhalter, Clemens Schulze-Briese, Pietro Zambon, Greg McMullan, Richard Henderson, Christopher J. Russo, Lewys Jones

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We have designed, fabricated and tested a lens with a chromatic aberration coefficient (Cc) of 1.0 mm, a 4.0 mm pole-gap and 2.0 mm bore that is wide enough to accommodate an anti-contamination system and an objective aperture. This lens extends the temporal-coherence envelope of the electron microscope beyond 2 Å, using a low-cost Schottky FEG. We hope that this lens design can be used to improve all 100 keV electron microscopes designed for single-particle electron cryomicroscopy (cryoEM).
Open Access
How to image single isolated atoms by using coherent low-energy electrons

September 26, 2025

Tatiana Latychevskaia

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Coherent low-energy electrons have been demonstrated as a practical tool for imaging individual macromolecules and two-dimensional (2D) crystals. Low-energy electrons exhibit unique properties: low radiation damage to biological molecules and high sensitivity to the local potentials. In this study, we outline the conditions at which single isolated charge-free atoms can be imaged by low-energy electron holography. A single atom produces an interference pattern consisting of concentric fringes of finite diameter and of very weak intensity. The diffraction angle θ , determined as the first minimum of the concentric rings interference pattern, exhibits similar dependency on the source-to-sample distance zs as sin θ ∼ 0.3/ zs 1/2 for electrons of different energies (50, 100 and 200 eV) and scattered off different elements (Li, C, and Cs). The results are compared to the recently reported experimental holograms of alkali atoms intercalated into bilayer graphene and adsorbed on top of graphene.

Issue 0

Issue 3

Special Issue: Micro and Nano CT; Guest editors: Silke Christiansen and Joachim Mayer

Issue 2

Special Issue: AI in Microscopy; Guest editors: Hubert Mantz and Paula Sampaio

Issue 1

Special Issue: FLIM in material and life sciences; Guest Editors: Werner Zuschratter and Uwe Ortmann

Issue 2

Issue 1

Special Issue: Volume Microscopy Across Scales

Methods in Microscopy publishes special and thematic issues focussed on important and emerging topics in the field of study. The journal has established a rigorous process to ensure that any special issue manuscripts follow the same high-quality standards and peer review processes as regular manuscripts. For further information on the journal’s peer review policy please see the "Instructions for Authors".

Recent Special Issues

Submission

You can easily submit your manuscript online: http://mc.manuscriptcentral.com/mim.

Before preparing a manuscript, please download the Submission Checklist, read the Instructions for Authors and have a look at our Ethical Guidelines and License to publish.
Please note that your manuscript may be checked for plagiarism via Crossref Similarity Check.

Your benefits of publishing with us

Open Access publication
Research freely available for all to read and download
Authors retain copyright – articles published under the Creative Commons Attribution (CC-BY-4.0) License
Rapid publication times
Every article easily discoverable because of Search Engine Optimization (SEO) and comprehensive abstracting and indexing services
Professional sales and marketing activities

Please note

Publication language is English. Manuscripts must be written in clear and concise English.
For a regular submission please us our MS word template (docx format). Authors who like to submit in Latex may use the De Gruyter style file.
The Template for Ethical and Legal Declarations is required for submission (needs to be customized by the submitting author on behalf of all others and uploaded as a separate doc-file at the time of the original submission).
MIM is an open access journal. Each article accepted for publication is subject to an article processing charge (APC). The current APC for MIM is € 2,000. In some cases, authors will be eligible for an APC waiver or discount. For further information on MIM’s APC waiver policy please see the MIM APC policy document.
If you have any general questions please visit our FAQ for authors.
For more detailed information please contact the Publishing Editor: Dr. Andreas Thoss, editor@methodsmicroscopy.org.

We are looking forward to receiving your manuscript!

Editor-in-Chief
Roger Wepf, University of Queensland, Australia

Editor
Martin Friedrich, Germany (editor@methodsmicroscopy.org)

Publishing Editor
Andreas Thoss, Germany

Associate Editors
Andrew Leis, University of Melbourne, Australia
Jens Rietdorf, Oswaldo Cruz Foundation, Rio de Janeiro, Brazil

Editorial Board

Li-An Chu, National Tsing Hua University, Taipei, Taiwan
Christian Eggeling, Jena University, Germany
Marc Thilo Figge, Jena University, Germany
Eric Hannsen, University of Mellbourne, Australia
Heinrich Hörber, University of Ulm, Germany
Jan Huisken, University of Göttingen, Germany
Andrew Leis, University of Melbourne, Australia
Vladislav Krzyzanek, The Czech Academy of Sciences, Brno, Czech Republic
Philippe Leclere, University of Mons, Belgium
Paul McMillian, University of Melbourne, Australia
Kota Miura, Bioimage Analysis & Research, Okayama, Japan
Wiebke Möbius, MPI Göttingen, Germany
Jens Riedorf, Oswaldo Cruz Foundation, Rio de Janeiro, Brazil
Francesco Simone Ruggeri, Wageningen University & Research, The Netherlands
Owen Schwartz, NIH-NIAID, Bethesda, Maryland, USA
Erin Tranfield, VIB Technologies, Bioimaging Core, Ghent, Belgium
Marc van Zandvoort, Maastricht University, The Netherlands
Andreas Walter, University of Aalen, Germany
Ralf Wolleschensky, Zeiss Microscopy Microscopy GmbH, Jena, Germnay
Xiuzhen Yu, Riken, Wakō, Japan
Ruobing Zhang, Chinese Academy of Science, Suzhou, Jiangsu, China

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Journal information

Additional information

eISSN:

2942-3899

Language:

English

Publisher:

De Gruyter

Additional information

First published:

January 1, 2024

Publication Frequency:

4 issues per year

Methods in Microscopy

Overview

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